In situ characterization technique for nanotribological investigations -: art. no. 016102

被引：4
|
作者：
Deladi, S [1 ]
Berenschot, JW [1 ]
Krijnen, GJM [1 ]
De Boer, MJ [1 ]
Tas, NR [1 ]
Elwenspoek, MC [1 ]
机构：
[1] Univ Twente Tranducers Sci & Technol, MESA Res Inst, NL-7500 AE Enschede, Netherlands
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2005年 / 76卷 / 01期
关键词：
D O I：
10.1063/1.1834712
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
An innovative technique has been developed to enable in situ monitoring of mechanical surface modification. The method is based on using a test surface and a sharp tip located on two different cantilevers; one for mechanical surface modification and the other for in situ detection of surface topography change. The device can be used in standard atomic force microscope, the image obtained during scanning contains information about a partly modified and a partly unmodified topography for each scanning line, thus quantification of surface topography modification (e.g., wear) or the change of different parameters (e.g., friction force) can be followed as it occurs. The characterization technique and typical results are presented. (C) 2005 American Institute of Physics.
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页数：3
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