Geometry-induced quantum effects in periodic nanostructures

被引:10
|
作者
Tavkhelidze, A. [1 ]
Jangidze, L. [1 ,2 ]
Mebonia, M. [1 ,3 ]
Piotrowski, K. [4 ]
Wieckowski, J. [4 ]
Taliashvili, Z. [2 ]
Skhiladze, G. [2 ]
Nadaraia, L. [5 ]
机构
[1] Ilia State Univ, Cholokashvili Ave 3-5, Tbilisi 0162, Georgia
[2] Inst Micro & Nano Elect, Chavchavadze Ave 13, Tbilisi 0179, Georgia
[3] Forschungszentrum Julich, Peter Grunberg Inst PGI, D-52425 Julich, Germany
[4] Polish Acad Sci, Inst Phys, Al Lotnikow 32-46, PL-02668 Warsaw, Poland
[5] Georgian Tech Univ, 77 Kostava Str, Tbilisi 0175, Georgia
关键词
doping; electrical properties; nanostructures; resistivity; silicon;
D O I
10.1002/pssa.201700334
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Recently, geometry-induced quantum effects in periodic nanostructures were introduced and observed. Nanograting has been shown to dramatically improve thermoelectric and electron emission properties, and originate a geometry induced doping or G-doping. Here, we concentrate on experimental investigation of G-doping. We fabricate nanograting (NG) layers and measure their electron transport properties. The grating was fabricated on the surface of a silicon on insulator (SOI) wafer device layer using laser interference lithography followed by reactive ion etching. Next, large square islands were shaped in the device layer. The characteristics of NG and plain islands were compared to investigate G-doping. Resistivity temperature dependences were recorded in the range of 4-300K. For all 21 samples, the NG layers show a 2-3 order of magnitude reduction in resistivity with respect to the plain layer. Hall coefficient and thermopower measurements demonstrate that the NG layers are n-type. Obtained G-doping level corresponded to an effective impurity concentration of 10(18)cm(-3). The dependence of the resistivity and Hall coefficient on temperature and magnetic field were recorded in the ranges of 2-300K and 0-3T, respectively.
引用
收藏
页数:6
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