Skin lipid phase behaviour: An x-ray diffraction and atomic force microscopy study.

被引:0
|
作者
Bouwstra, JA
tenGrotenhuis, E
Demel, R
Gooris, GS
Ponec, M
机构
来源
23RD INTERNATIONAL SYMPOSIUM ON CONTROLLED RELEASE OF BIOACTIVE MATERIALS, 1996 PROCEEDINGS | 1996年
关键词
D O I
暂无
中图分类号
R9 [药学];
学科分类号
1007 ;
摘要
引用
收藏
页码:313 / 314
页数:2
相关论文
共 50 条
  • [21] Morphology and phase behaviour of blends of syndiotactic and isotactic polypropylene .1. X-ray scattering, light microscopy, atomic force microscopy, and scanning electron microscopy
    Thomann, R
    Kressler, J
    Setz, S
    Wang, C
    Mulhaupt, R
    POLYMER, 1996, 37 (13) : 2627 - 2634
  • [22] AN X-RAY DIFFRACTION STUDY OF PHYSICAL STATE OF LIPID PHASE IN BIOLOGICAL MEMBRANES
    FINEAN, JB
    KNUTTON, S
    LIMBRICK, AR
    COLEMAN, R
    MOLECULAR CRYSTALS AND LIQUID CRYSTALS, 1969, 7 : 347 - &
  • [23] Microbeam X-ray diffraction study of lipid structure in stratum corneum of human skin
    Yagi, Naoto
    Aoyama, Koki
    Ohta, Noboru
    PLOS ONE, 2020, 15 (05):
  • [24] Strain-driven phase boundaries in BiFeO3 thin films studied by atomic force microscopy and x-ray diffraction
    Liu, Heng-Jui
    Liang, Chen-Wei
    Liang, Wen-I
    Chen, Hsiang-Jung
    Yang, Jan-Chi
    Peng, Chun-Yen
    Wang, Guang-Fu
    Chu, Feng-Nan
    Chen, Yi-Chun
    Lee, Hsin-Yi
    Chang, Li
    Lin, Su-Jien
    Chu, Ying-Hao
    PHYSICAL REVIEW B, 2012, 85 (01)
  • [25] Solving the phase problem of X-ray diffraction using atomic resolution X-ray holograms
    Xu, G
    ACTA CRYSTALLOGRAPHICA SECTION A, 1997, 53 : 236 - 241
  • [26] Characterization of thin films for X-ray and neutron waveguiding by X-ray reflectivity and atomic force microscopy
    Pelliccia, Daniele
    Kandasamy, Sasikaran
    James, Michael
    PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2013, 210 (11): : 2416 - 2422
  • [27] An X-Ray Diffraction Study of Lipid Films with ICHPHAN
    A. V. Krivandin
    A. N. Goloshchapov
    Biophysics, 2024, 69 (2) : 225 - 230
  • [28] Structural investigations of TiO2:: Tb thin films by X-ray diffraction and atomic force microscopy
    Kaczmarek, D.
    Domaradzki, J.
    Wojcieszak, D.
    Wasielewski, R.
    Borkowska, A.
    Prociow, E. L.
    Ciszewski, A.
    APPLIED SURFACE SCIENCE, 2008, 254 (14) : 4303 - 4307
  • [29] Structure of Nanocrystalline Titania Ceramics Studied by X-ray Diffraction, Atomic Force Microscopy, and Thermal Phonon Kinetics
    V. V. Ivanov
    S. N. Ivanov
    O. V. Karban
    A. V. Taranov
    E. N. Khazanov
    V. R. Khrustov
    Inorganic Materials, 2004, 40 : 1233 - 1238
  • [30] Characterization of kaolinite in the hardsetting clay fraction using atomic force microscopy, X-ray diffraction, and the Rietveld method
    Prandel, Luis Valerio
    Piccolomini Dias, Nivea Maria
    Saab, Sergio da Costa
    Brinatti, Andre Mauricio
    Balarezo Giarola, Neyde Fabiola
    Pires, Luiz Fernando
    JOURNAL OF SOILS AND SEDIMENTS, 2017, 17 (08) : 2144 - 2155