Differences between the recording characteristics of thin MP and ME tape are studied. The effect of the thickness reduction of MP tape is also investigated. When thin MP tape (with thickness 140 nm) is compared with ME tape (with thickness 150 nm), we observe a better signal and overwrite response for the ME tape. Through simulations the influence of an easy axis out-of-plane and a different reversal mechanism in ME tape is related to overwrite behavior.
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Univ Fed Santa Catarina, Grad Program Mat Sci & Engn, Dept Chem Engn, BR-88040900 Florianopolis, SC, BrazilUniv Fed Santa Catarina, Grad Program Mat Sci & Engn, Dept Chem Engn, BR-88040900 Florianopolis, SC, Brazil
da Silva, Andre Luiz
Bernardin, Adriano Michael
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Univ Extremo Sul Catarinense, Ceram Mat Grp, BR-88806000 Criciuma, SC, BrazilUniv Fed Santa Catarina, Grad Program Mat Sci & Engn, Dept Chem Engn, BR-88040900 Florianopolis, SC, Brazil
Bernardin, Adriano Michael
Hotza, Dachannir
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Univ Fed Santa Catarina, Grad Program Mat Sci & Engn, Dept Chem Engn, BR-88040900 Florianopolis, SC, BrazilUniv Fed Santa Catarina, Grad Program Mat Sci & Engn, Dept Chem Engn, BR-88040900 Florianopolis, SC, Brazil
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Carnegie Mellon Univ, Dept Mat Sci & Engn, Ctr Data Storage Syst, Pittsburgh, PA 15213 USACarnegie Mellon Univ, Dept Mat Sci & Engn, Ctr Data Storage Syst, Pittsburgh, PA 15213 USA
Lee, HS
Laughlin, DE
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机构:Carnegie Mellon Univ, Dept Mat Sci & Engn, Ctr Data Storage Syst, Pittsburgh, PA 15213 USA
Laughlin, DE
Bain, JA
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机构:Carnegie Mellon Univ, Dept Mat Sci & Engn, Ctr Data Storage Syst, Pittsburgh, PA 15213 USA