March SR3C: A Test for a reduced model of all static simple three-cell coupling faults in random-access memories

被引：5
|
作者：
Cascaval, Petru [1 ]
Cascaval, Doina [2 ]
机构：
[1] Gheorghe Asachi Tech Univ Iasi, Dept Comp Engn, Iasi 700050, Romania
[2] Gheorghe Asachi Tech Univ Iasi, Dept Ind Engn, Iasi 700050, Romania
来源：
MICROELECTRONICS JOURNAL | 2010年 / 41卷 / 04期
关键词：
Memory testing; Static fault model; Three-cell coupling fault; Fault primitive; March test; FUNCTIONAL FAULTS;
D O I：
10.1016/j.mejo.2010.02.004
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A fault primitive-based analysis of all static simple (i.e., not linked) three-cell coupling faults in n x 1 random-access memories (RAMs) is discussed. All realistic static coupling faults that have been shown to exist in real designs are considered: state coupling faults, transition coupling faults, write disturb coupling faults, read destructive coupling faults, deceptive read destructive coupling faults, and incorrect read coupling faults. A new March test with 66n operations able to detect all static simple three-cell coupling faults is proposed. To compare this test with other industrial March tests, simulation results are also presented in this paper. (C) 2010 Elsevier Ltd. All rights reserved.
引用
收藏
页码：212 / 218
页数：7
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