March test for 3-coupling faults in random-access memories. A built-in self-testing logic design

被引：0

作者：

Caşcaval, Petru ^{[1
]}

Silion, Radu ^{[1
]}

机构：

[1] Dept. of Computer Science and Engineering, Gh. Asachi Technical University of Iaşi, 53A, D. Mangeron, 700050 Iaşi, Romania

来源：

WSEAS Transactions on Computers | 2007年 / 6卷 / 02期

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摘要：

引用

页码：215 / 222

共 14 条

[1] BUILT-IN SELF-TESTING OF RANDOM-ACCESS MEMORIES
FRANKLIN, M
SALUJA, KK
COMPUTER, 1990, 23 (10) : 45 - 56
[2] Efficient march test for 3-coupling faults in random access memories
Cascaval, P
Bennett, S
MICROPROCESSORS AND MICROSYSTEMS, 2001, 24 (10) : 501 - 509
[3] Efficient march tests for a reduced 3-coupling and 4-coupling faults in random-access memories
Cascaval, P
Bennett, S
Hutanu, C
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2004, 20 (03): : 227 - 243
[4] Efficient March Tests for a Reduced 3-Coupling and 4-Coupling Faults in Random-Access Memories
Petru Caşcaval
Stuart Bennett
Corneliu Huţanu
Journal of Electronic Testing, 2004, 20 : 227 - 243
[5] A MARCH TEST FOR FUNCTIONAL FAULTS IN SEMICONDUCTOR RANDOM-ACCESS MEMORIES
SUK, DS
REDDY, SM
IEEE TRANSACTIONS ON COMPUTERS, 1981, 30 (12) : 982 - 985
[6] AN EFFICIENT BUILT-IN SELF TESTING FOR RANDOM-ACCESS MEMORY
MAZUMDER, P
PATEL, JH
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 1989, 36 (02) : 246 - 253
[7] March test algorithm for unlinked static reduced three-cell coupling faults in random-access memories
Cascaval, P.
Cascaval, D.
MICROELECTRONICS JOURNAL, 2019, 93
[8] A Multibackground March Test for Static Neighborhood Pattern-Sensitive Faults in Random-Access Memories
Huzum, C.
Cascaval, P.
ELEKTRONIKA IR ELEKTROTECHNIKA, 2012, 119 (03) : 81 - 86
[9] March SR3C: A Test for a reduced model of all static simple three-cell coupling faults in random-access memories
Cascaval, Petru
Cascaval, Doina
MICROELECTRONICS JOURNAL, 2010, 41 (04) : 212 - 218
[10] A new test pattern generator design approach for VLSI built-in self-testing
Yarmolik, VN
Murashko, IA
AVTOMATIKA I VYCHISLITELNAYA TEKHNIKA, 1995, (06): : 25 - 35

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