Stability of large-area molecular junctions

被引：39
|
作者：
Akkerman, Hylke B. [1 ]
Kronemeijer, Auke J. [1 ]
Harkema, Jan [1 ]
van Hal, Paul A. [2 ]
Smits, Edsger C. P. [1 ,2 ]
de Leeuw, Dago M. [1 ,2 ]
Blom, Paul W. M. [1 ]
机构：
[1] Univ Groningen, Zernike Inst Adv Mat, NL-9747 AG Groningen, Netherlands
[2] Philips Res Labs, NL-5656AE Eindhoven, Netherlands
来源：
ORGANIC ELECTRONICS | 2010年 / 11卷 / 01期
关键词：
Molecular electronics; Molecular devices; Self-assembled monolayers; Stability; Alkanedithiols; SELF-ASSEMBLED MONOLAYERS; ALKYL THIOL MONOLAYERS; SPECTROSCOPY; ELECTRONICS; METALS;
D O I：
10.1016/j.orgel.2009.09.013
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The stability of molecular junctions is crucial for any application of molecular electronics. Degradation of molecular junctions when exposed to ambient conditions is regularly observed. In this report the stability of large-area molecular junctions under ambient conditions for more than two years is presented. Furthermore, the thermal stability of molecular junctions at elevated temperatures is investigated. A transition temperature at 50 degrees C was observed for molecular junctions based on self-assembled monolayers of alkanedithiols, above which the resistance decreases exponentially with temperature. This transition temperature limits the process window during fabrication and the temperature window during operation. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码：146 / 149
页数：4
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