Polarization Characteristics Variation of Visible Light on Reflection from ZnO Based Amorphous Films

被引：9

作者：

Misra, Kamakhya Prakash ^{[1
]}

Srivastava, Atul ^{[1
]}

Shukla, R. K. ^{[1
]}

Misra, P. ^{[2
]}

Srivastava, Anchal ^{[1
]}

机构：

[1] Univ Lucknow, Dept Phys, Lucknow 226007, Uttar Pradesh, India

[2] Raja Ramanna Ctr Adv Technol, Indore 452013, India

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 2010年 / 49卷 / 06期

关键词：

PULSED-LASER DEPOSITION; ANISOTROPIC THIN-FILM; ELECTRICAL-PROPERTIES; EMITTING DEVICES; GROWTH;

D O I：

10.1143/JJAP.49.062602

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The change in polarization characteristics of visible light reflected from amorphous ZnO and Ca doped ZnO thin films were studied. Highly transparent thin films of ZnO and Ca doped ZnO were deposited on glass substrate by sol-gel spin coating technique. Reflection studies revealed that the change in the polarization state and azimuth of the electric vector introduced by sample films are quite different as compared to those for reflected beam from uncoated substrate. The rotation of electric vector in reflected light was found to depend considerably on variation in angle of incidence as well as Ca concentration in ZnO. Films, interestingly, changed the incident plane polarized light to elliptically polarized on reflection. (C) 2010 The Japan Society of Applied Physics DOI: 10.1143/JJAP.49.062602

引用

页码：0626021 / 0626026

页数：6

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