The power effect in write-in process of Ag-TCNQ electric recording thin film

被引：0
|
作者：
Wan, XG [1 ]
Li, J [1 ]
Chen, DY [1 ]
Jiang, YM [1 ]
Hua, ZY [1 ]
机构：
[1] Fudan Univ, Vacuum Phys Lab, Shanghai 200433, Peoples R China
来源：
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 2000年 / 181卷 / 02期
关键词：
D O I：
10.1002/1521-396X(200010)181:2<R13::AID-PSSA999913>3.0.CO;2-E
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
[No abstract available]
引用
收藏
页码：R13 / R15
页数：3
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