Photon Counting Error Rates in Single-Bit and Multi-Bit Quanta Image Sensors

被引：22
|
作者：
Fossum, Eric R. [1 ]
机构：
[1] Dartmouth Coll, Thayer Sch Engn, Hanover, NH 03755 USA
来源：
IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY | 2016年 / 4卷 / 03期
关键词：
CMOS image sensor; quanta image sensor; jot device; photon counting; high conversion gain; low read noise; low dark current; single photon detectors; CONVERSION GAIN; READ NOISE; PERFORMANCE; CMOS; JOT;
D O I：
10.1109/JEDS.2016.2536722
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Photon or photoelectron counting error (bit error) rates are determined for single-bit and multi-bit quanta image sensors (QISs). The results are also applicable to CMOS image sensors with deep sub-electron read noise. The effects of read noise, gain variation, and quanta exposure level on the counting errors (bit errors) in a QIS device are investigated. The interaction of these factors yields complex behavior of the counting error rate. Still, photon-counting is predicted to be remarkably accurate for quanta exposures greater than unity despite read noise and conversion-gain variation, and accurate at very low-light levels if the read noise is less than 0.15e- r.m.s.
引用
收藏
页码：136 / 143
页数：8
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