Identifying Electrical Ageing in Polymeric Insulation

被引：0
|
作者：
Fothergill, J. C. [1 ]
Mazzanti, G. [2 ]
Diban, B. [2 ]
机构：
[1] City Univ London, Northampton Sq, London EC1V 0HB, England
[2] Univ Bologna, Dept Elect Elect & Informat Engn, I-40136 Bologna, Italy
来源：
PROCEEDINGS OF THE 2020 3RD IEEE INTERNATIONAL CONFERENCE ON DIELECTRICS (ICD 2020) | 2020年
关键词：
BREAKDOWN;
D O I：
10.1109/ICD46958.2020.9341973
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A brief review of the random nature of the processes involved in producing a breakdown path through an insulator suggests that breakdown may occur spontaneously, i.e. without any physical ageing/degradation, especially at high electric fields. This can be supported by considering the distribution function of the times-to-breakdown and, in particular, the shape parameter of the Weibull distribution. The work is supported by data from tests on PET and XLPE and from a preliminary computer simulation.
引用
收藏
页码：53 / 56
页数：4
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