Identifying Electrical Ageing in Polymeric Insulation

被引：0

作者：

Fothergill, J. C. ^{[1
]}

Mazzanti, G. ^{[2
]}

Diban, B. ^{[2
]}

机构：

[1] City Univ London, Northampton Sq, London EC1V 0HB, England

[2] Univ Bologna, Dept Elect Elect & Informat Engn, I-40136 Bologna, Italy

来源：

PROCEEDINGS OF THE 2020 3RD IEEE INTERNATIONAL CONFERENCE ON DIELECTRICS (ICD 2020) | 2020年

关键词：

BREAKDOWN;

D O I：

10.1109/ICD46958.2020.9341973

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A brief review of the random nature of the processes involved in producing a breakdown path through an insulator suggests that breakdown may occur spontaneously, i.e. without any physical ageing/degradation, especially at high electric fields. This can be supported by considering the distribution function of the times-to-breakdown and, in particular, the shape parameter of the Weibull distribution. The work is supported by data from tests on PET and XLPE and from a preliminary computer simulation.

引用

页码：53 / 56

页数：4

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