Modeling focused beam reflectance measurement and its application to sizing of particles of variable shape

被引:19
|
作者
Vaccaro, Andrea
Sefcik, Jan
Morbidelli, Massimo [1 ]
机构
[1] ETH, Inst Chem & Bioengn, CH-8093 Zurich, Switzerland
[2] Univ Strathclyde, Dept Chem & Proc Engn, Glasgow, Lanark, Scotland
关键词
chord length distribution; focused beam reflectance measurement; modeling; particle sizing; thin cylindrical particle;
D O I
10.1002/ppsc.200600977
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A model for particle detection in focused beam reflectance measurement is presented in the general case of particles of any convex shape. Shape dependent convolution relationships between measured chord length distribution (CLD), particle size distribution (PSD) and particle mass distribution (PMD) are derived and an explicit formula for the weighting characteristic length is given in terms of particle shape. Based on the derived convolution relationships, equations relating moments of the CLD, PSD and PMD are obtained. Issues related to the definition of particle size of non spherical objects and its connection to the particle sizing technique are discussed. Based on the moment relationships, particle size is defined for focused beam reflectance measurement measurements in terms of a CLD equivalent sphere. CLD and characteristic length for a thin cylinder are obtained analytically and used as simple model in order to illustrate issues in sizing particles of variable shape, General conclusions regarding the role of the weighting characteristic length on the behavior of the measured CLD are drawn.
引用
收藏
页码:360 / 373
页数:14
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