Quantitative analysis of molecularly stacked layer structures in supported organic thin films by synchrotron grazing-incidence X-ray scattering

被引：16
|
作者：
Yoon, Jinhwan
Choi, Seungchel
Jin, Sangwoo
Jin, Kyeong Sik
Heo, Kyuyoung
Ree, Moonhor [1 ]
机构：
[1] Pohang Univ Sci & Technol, Dept Chem, Pohang Accelerator Lab, Natl Res Lab Polymer Synth & Phys,Ctr Integrated, Pohang 790784, South Korea
[2] Pohang Univ Sci & Technol, BK Sch Mol Sci, Pohang 790784, South Korea
来源：
JOURNAL OF APPLIED CRYSTALLOGRAPHY | 2007年 / 40卷
关键词：
D O I：
10.1107/S0021889806056056
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
In this study, we derive a grazing-incidence X-ray scattering (GIXS) formula to analyze quantitatively GIXS patterns for molecularly stacked layer structures in substrate-supported nanoscale thin films. We apply this formula in the quantitative analysis of GIXS patterns obtained for S-docosanylcysteine thin films on silicon substrates with native oxide layers. This analysis successfully provides information on the structural parameters and orientation of the molecular layer stack developed in S-docosanylcysteine thin films.
引用
收藏
页码：S669 / S674
页数：6
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