共 50 条
- [42] Depth-dependent EBIC microscopy of radial-junction Si micropillar arrays Yoon, Heayoung P. (heayoung.yoon@utah.edu), 1600, Springer (50):
- [46] Depth sensing and dissipation in tapping mode atomic force microscopy REVIEW OF SCIENTIFIC INSTRUMENTS, 2004, 75 (08): : 2529 - 2535
- [49] Elasticity of Aspergillus nidulans hyphae assessed with atomic force microscopy (AFM). ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2004, 227 : U227 - U227