A 0.6-1.0 V, 25.9 mm(2) boost converter is proposed to generate resistive random access memory (ReRAM) write (set/reset) voltage for three-dimensional (3D) integrated ReRAM and NAND flash hybrid solid-state drive (SSD). The proposed boost converter uses an integrated area-efficient V-BUF generation circuit to obtain short ReRAM sector write time, small circuit size, and small energy consumption simultaneously. In specific, the proposed boost converter reduces ReRAM sector write time by 65% compared with a conventional one-stage boost converter (Conventional 1) which uses 1.0 V operating voltage. On the other hand, by using the same ReRAM sector write time, the proposed boost converter reduces 49% circuit area and 46% energy consumption compared with a conventional two-stage boost converter (Conventional 2). In addition, by using the proposed boost converter, the operating voltage, V-DD, can be reduced to 0.6 V. The lowest 159 nJ energy consumption can be obtained when V-DD is 0.7 V. (C) 2016 The Japan Society of Applied Physics
