0.6 V Operation, 16 % Faster Set/Reset ReRAM Boost Converter with Adaptive Buffer Voltage for ReRAM and NAND Flash Hybrid Solid-State Drives

被引:0
|
作者
Tsurumi, Kota [1 ]
Tanaka, Masahiro [1 ]
Takeuchi, Ken [1 ]
机构
[1] Chuo Univ, Bunkyo Ku, 1-13-27 Kasuga, Tokyo 1128551, Japan
来源
PROCEEDINGS OF THE EIGHTEENTH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN (ISQED) | 2017年
关键词
Boost Converter; Charge Pump; Resistive Random Access Memory (ReRAM); 3D-Integrated ReRAM and NAND Flash Hybrid SSD;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A 0.6 V boost converter with adaptive buffer voltage is proposed for 3D-integrated Random Access Memory (ReRAM) and NAND flash memory hybrid solid-state drive (SSD). The proposed boost converter with 1- or 2-stage charge pump has two advantages by changing buffer voltage depending on program data size. First, the proposed boost converter with 2-stage charge pump (proposed circuit) decreases SET/RESET time of ReRAM by 97 % compared with the conventional boost converter with no charge pump (conventional 1) [1]. Second, compared with the conventional boost converter with 1- stage charge pump (conventional 2) [2], the total program time is decreased by 16 % with the proposed circuit when the program data size is as large as 10 sectors (5 kbyte). The boost converter and the charge pump are fabricated with the 180 nm standard CMOS process.
引用
收藏
页码:81 / 86
页数:6
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