共 50 条
- [31] Determination of scattering losses in ArF* excimer laser alldielectric mirrors for 193 nm microlithography applications Laser-Induced Damage In Optical Materials: 2004, 2005, 5647 : 9 - 22
- [32] MELTING THRESHOLD OF CRYSTALLINE AND AMORPHIZED SI IRRADIATED WITH A PULSED ARF (193 NM) EXCIMER LASER APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1988, 45 (04): : 361 - 364
- [35] High power 193 nm excimer lasers for DIN lithography OPTICAL MICROLITHOGRAPHY XIV, PTS 1 AND 2, 2001, 4346 : 577 - 584
- [36] Laser gain measurements at 193 nm in a small discharge cell containing ArF excimer laser gas mixtures Applied Physics B, 2008, 90 : 455 - 460
- [37] Laser gain measurements at 193 nm in a small discharge cell containing ArF excimer laser gas mixtures APPLIED PHYSICS B-LASERS AND OPTICS, 2008, 90 (3-4): : 455 - 460