Determination of 51Cr and 241Am X-ray and gamma-ray emission probabilities per decay

被引：8
|
作者：
Moreira, Denise S. [1 ]
Koskinas, Marina F. [1 ]
Yamazaki, Ione M. [1 ]
Dias, Mauro S. [1 ]
机构：
[1] CRPq, IPEN, CNEN SP, BR-05422970 Sao Paulo, Brazil
来源：
APPLIED RADIATION AND ISOTOPES | 2010年 / 68卷 / 4-5期
关键词：
Emission probability per decay; Americium; 241; Chromium; 51; Semiconductor detectors;
D O I：
10.1016/j.apradiso.2009.11.004
中图分类号：
O61 [无机化学];
学科分类号：
070301 ; 081704 ;
摘要：
In this paper results of X-ray and gamma-ray emission probabilities per decay of Cr-51 and Am-241 are presented. The measurements were carried out by means of HPGe planar and REGe spectrometers. The activity of Cr-51 and Am-241 samples was determined in a 4 pi beta-gamma coincidence counting system. The HPGe spectrometers were calibrated in a well defined geometry by means of Mn-54, Fe-55, Co-57, Ba-133, Eu-152, Ho-166m and Am-241 sources, previously standardized in a 4 pi beta-gamma coincidence system. The MCNP Monte Carlo code was used for simulation of the REGe spectrometer calibration curve, for the selected geometry, and compared with the experimental curve. The experimental results were compared with data from literature. (C) 2009 Elsevier Ltd. All rights reserved.
引用
收藏
页码：596 / 599
页数：4
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