Design and simulation of Mg2Si/Si avalanche photodiode

被引:2
|
作者
Wang Ao-Shuang [1 ]
Xiao Qing-Quan [1 ]
Chen Hao [1 ]
He An-Na [1 ]
Qin Ming-Zhe [1 ]
Xie Quan [1 ]
机构
[1] Guizhou Univ, Coll Big Data & Informat Engn, Inst Adv Optoelect Mat & Technol, Guiyang 550025, Peoples R China
关键词
SACM-APD; Mg2Si/Si heterojunction; spectral response; gain coefficient; SILICON;
D O I
10.7498/aps.70.20201923
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
InGaAs and HgCdTe materials are widely used in short wave infrared photodetectors, which contain heavy metal elements. The massive use of the heavy metal elements naturally results in their scarcity, and the nonnegligible environmental pollution. Searching for other suitable materials for infrared devices becomes a key to solving the above problems. As a kind of abundant and eco-friendly material, Mg2Si has a high absorption coefficient in the near-infrared band. Its application in infrared detector makes it possible to replace the infrared devices containing toxic elements on the market in the future. The Mg2Si/Si avalanche photodiode(APD) with separation structure of absorption layer, charge layer and multiplication layer, with Mg2Si serving as the absorption layer, is constructed by using the Atlas module in Silvaco software. The effects of the thickness and doping concentration of the charge layer and multiplier layer on the distribution of internal electric field, punchthrough voltage, breakdown voltage (V-b), C- V characteristics, and transient response of Mg2Si/Si SACM-APD are simulated. The effects of bias voltage on the I- V characteristics and spectral response are analyzed. The punch-through voltage, breakdown voltage, dark current density, gain coefficient (M-n) and the current amplification factor (M) after avalanche effect of APD are obtained after the structure optimization. According to the simulation results, the spectral response wavelength of the device is extended to 1.6 mu m, so the selection of Mg2Si as the absorption layer effectively extends the spectral response band of Si based APD. When the wavelength of incident light is 1.31 mu m and the optical power is 10 mW/cm(2), the obtained punch-through voltage is 17.5 V, and the breakdown voltage is 50 V. When the bias voltage is 47.5 V (0.95 V-b), the peak value of spectral response is 25 A/W at a wavelength of 1.1 mu m, a density of dark current is about 3.6 x 10(-5) A/cm(2), a multiplication factor M-n is 19.6, and M-n achieves a maximum value of 102 when the device is broken down. Meanwhile, the current amplification factor M after avalanche effect is 75.4, and the current gain effect of the SACM structure is obvious. The peak value of spectral response for the pin-type photodiode in the previous study is only 0.742 A/W. Comparing with the pin-type photodiode, the spectral response of Mg2Si/Si SACMAPD is greatly improved. In this work, the structure parameters of the device are optimized, which lays a nice foundation for fabricating the high-performance devices.
引用
收藏
页数:9
相关论文
共 30 条
  • [21] Preparation of Schottky contacts on n-type Mg2Si single crystalline substrate
    Sekino, K.
    Midonoya, M.
    Udono, H.
    Yamada, Y.
    [J]. ASIA-PACIFIC CONFERENCE ON SEMICONDUCTING SILICIDES SCIENCE AND TECHNOLOGY TOWARDS SUSTAINABLE OPTOELECTRONICS (APAC-SILICIDE 2010), 2011, 11 : 171 - 173
  • [22] Low-frequency noise, reliability and quality of high-speed avalanche breakdown detectors
    Smetona, S
    Matukas, J
    Palenskis, V
    Olechnovicius, M
    Kaminskas, KA
    Mallard, R
    [J]. APPLICATIONS OF PHOTONIC TECHNOLOGY, CLOSING THE GAP BETWEEN THEORY, DEVELOPMENT, AND APPLICATION, PT 1 AND 2, 2004, 5577 : 834 - 842
  • [23] Sze S M, 2008, PHYS SEMICONDUCTOR D, P514
  • [24] Crystal growth and characterization of Mg2Si for IR-detectors and thermoelectric applications
    Udono, Haruhiko
    Tajima, Hiroyuki
    Uchikoshi, Masahito
    Itakura, Masaru
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 2015, 54 (07)
  • [25] Infrared photoresponse from pn-junction Mg2Si diodes fabricated by thermal diffusion
    Udono, Haruhiko
    Yamanaka, Yusuke
    Uchikoshi, Masahito
    Isshiki, Minoru
    [J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 2013, 74 (02) : 311 - 314
  • [26] Modeling of frequency-dependent negative differential capacitance in InGaAs/InP photodiode
    Wang, Yidong
    Chen, Jun
    Xu, Jintong
    Li, Xiangyang
    [J]. INFRARED PHYSICS & TECHNOLOGY, 2018, 89 : 41 - 45
  • [27] Research progress of room temperature semiconductor infrared photodetectors
    Xie Tian
    Ye Xin-Hui
    Xia Hui
    Li Ju-Zhu
    Zhang Shuai-Jun
    Jiang Xin-Yang
    Deng Wei-Jie
    Wang Wen-Jing
    Li Yu-Ying
    Liu Wei-Wei
    Li Xiang
    Li Tian-Xin
    [J]. JOURNAL OF INFRARED AND MILLIMETER WAVES, 2020, 39 (05) : 583 - 594
  • [28] Characteristics of InGaAs quantum dot infrared photodetectors
    Xu, SJ
    Chua, SJ
    Mei, T
    Wang, XC
    Zhang, XH
    Karunasiri, G
    Fan, WJ
    Wang, CH
    Jiang, J
    Wang, S
    Xie, XG
    [J]. APPLIED PHYSICS LETTERS, 1998, 73 (21) : 3153 - 3155
  • [29] Yuan H., 2018, HIGH PERFORMANCE SWI, V10766
  • [30] Avalanche photodiode single-photon detector with high time stability
    Zhang Hai-Yan
    Wang Lin-Li
    Wu Chen-Yi
    Wang Yu-Rong
    Yang Lei
    Pan Hai-Feng
    Liu Qiao-Li
    Guo Xia
    Tang Kai
    Zhang Zhong-Ping
    Wu Guang
    [J]. ACTA PHYSICA SINICA, 2020, 69 (07)