Ferromagnetic semiconductor superlattices studied by polarized neutron reflectometry

被引：1
|
作者：
Kepa, H.
Majkrzak, C. F.
Sipatov, A. Yu.
Giebultowicz, T. M.
机构：
[1] Warsaw Univ, Inst Expt Phys, PL-00681 Warsaw, Poland
[2] Oregon State Univ, Dept Phys, Corvallis, OR 97331 USA
[3] NIST, Ctr Neutron Res, Natl Inst Stand & Technol, Gaithersburg, MD 20899 USA
[4] Kharkov State Polytech Univ, UA-31002 Kharkov, Ukraine
来源：
PHYSICA B-CONDENSED MATTER | 2007年 / 397卷 / 1-2期
基金：
美国国家科学基金会;
关键词：
magnetic semiconductor; superlattices; polarized neutron reflectivity;
D O I：
10.1016/j.physb.2007.02.019
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
The results of extensive neutron reflectometry studies of EuS-based ferromagnetic semiconductor superlattices (SL's) which exhibit interlayer exchange coupling (IEC) are presented. The SL's grown on two different substrates, (0 0 1)KCl and (1 1 1)BaF2, with two types of nonmagnetic spacer material, PbS (narrow gap) and YbSe (wide gap semiconductor), were investigated. Neutron reflectometry measurements revealed pronounced antiferromagnetic IEC in the systems grown on (0 0 1)KCl substrate, whereas in the EuS/PbS superlattices grown on (1 1 1)BaF2 a ferromagnetic IEC has been found. The in-plane magnetic anisotropy and the population of the magnetic domains were studied by polarized neutron reflectivity. The in-plane directions of easy-axes has thus been determined in the all investigated systems. A nonuniform distribution of domains magnetization directions among the easy in-plane axes has been found. (c) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码：36 / 42
页数：7
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