Test and repair of non-volatile commodity and embedded memories (NAND flash memory)

被引：0
|
作者：
Shirota, R [1 ]
机构：
[1] Toshiba Co Ltd, Semicond Co, Isogo Ku, Yokohama, Kanagawa, Japan
来源：
INTERNATIONAL TEST CONFERENCE 2002, PROCEEDINGS | 2002年
关键词：
D O I：
10.1109/TEST.2002.1041924
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：1221 / 1221
页数：1
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