Test and repair of non-volatile commodity and embedded memories (NAND flash memory)

被引：0
|
作者：
Shirota, R [1 ]
机构：
[1] Toshiba Co Ltd, Semicond Co, Isogo Ku, Yokohama, Kanagawa, Japan
来源：
INTERNATIONAL TEST CONFERENCE 2002, PROCEEDINGS | 2002年
关键词：
D O I：
10.1109/TEST.2002.1041924
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：1221 / 1221
页数：1
相关论文
共 50 条
  • [1] Test and repair of non-volatile commodity and embedded memories
    Tsuchida, S
    INTERNATIONAL TEST CONFERENCE 2002, PROCEEDINGS, 2002, : 1223 - 1223
  • [2] Unified Non-Volatile Memory and NAND Flash Memory Architecture in Smartphones
    Chen, Renhai
    Wang, Yi
    Hu, Jingtong
    Liu, Duo
    Shao, Zili
    Guan, Yong
    2015 20TH ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE (ASP-DAC), 2015, : 340 - 345
  • [3] A Versatile Emulator for the Aging Effect of Non-Volatile Memories: The case of NAND Flash
    Prodromakis, Antonios
    Korkotsides, Stelios
    Antonakopoulos, Theodore
    2014 17TH EUROMICRO CONFERENCE ON DIGITAL SYSTEM DESIGN (DSD), 2014, : 9 - 15
  • [4] Test and repair of embedded flash memories
    Daga, JM
    INTERNATIONAL TEST CONFERENCE 2002, PROCEEDINGS, 2002, : 1219 - 1219
  • [5] Non-volatile and Flash memory developments
    Neale, R
    ELECTRONIC ENGINEERING, 2001, 73 (898): : 11 - +
  • [6] Status and Perspectives of embedded Non-Volatile Memories
    Maurelli, Alfonso
    2013 INTERNATIONAL CONFERENCE ON IC DESIGN AND TECHNOLOGY (ICICDT), 2013, : 77 - 80
  • [7] Embedded Non-Volatile Memory Technologies
    Shum, Danny
    CHINA SEMICONDUCTOR TECHNOLOGY INTERNATIONAL CONFERENCE 2011 (CSTIC 2011), 2011, 34 (01): : 3 - 8
  • [8] Read Threshold Calibration for Non-Volatile Flash Memories
    Rajab, Mohammed
    Thiers, Johann-Philipp
    Freudenberger, Juergen
    2019 IEEE 9TH INTERNATIONAL CONFERENCE ON CONSUMER ELECTRONICS (ICCE-BERLIN), 2019, : 109 - 113
  • [9] Characterization and Modelling of Gate Current Injection in Embedded Non-Volatile Flash Memory
    Zaka, Alban
    Garetto, Davide
    Rideau, Denis
    Palestri, Pierpaolo
    Manceau, Jean-Philippe
    Dornel, Erwan
    Rafhay, Quentin
    Clerc, Raphael
    Leblebici, Yusuf
    Tavernier, Clement
    Jaouen, Herve
    2011 IEEE INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES (ICMTS), 2011,
  • [10] Test and Reliability of Emerging Non-Volatile Memories
    Hamdioui, Said
    Pouyan, Peyman
    Li, Huawei
    Wang, Ying
    Raychowdhur, Arijit
    Yoon, Insik
    2017 IEEE 26TH ASIAN TEST SYMPOSIUM (ATS), 2017, : 170 - 178
12345