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Variables Sampling Plan for Resubmitted Lots in a Process with Linear Profiles
被引:16
|作者:
Wang, Fu-Kwun
[1
]
机构:
[1] Natl Taiwan Univ Sci & Technol, Dept Ind Management, Taipei 106, Taiwan
关键词:
variables sampling plan;
resubmitted lots;
linear profiles;
process-yield index;
PROCESS CAPABILITY;
INSPECTION;
FRACTION;
D O I:
10.1002/qre.1812
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
Acceptance sampling plans include a sampling scheme and a set of rules for determining whether an inspection lot from a supplier should be accepted or rejected. In some circumstances, the supplier is allowed to resubmit lots for further inspection when the original inspection result is unacceptable. In this study, two variables sampling plans based on the process-yield index for a process with linear profiles are proposed to deal with lot sentencing. The single sampling plan is a special case of the resubmitted lots sampling plan. The plan parameters are determined using a nonlinear optimization method under the given values of producer's risk, consumer's risk, acceptable quality level, and lot tolerance percent defective. Numerous tables are provided to determine the plan parameters. One real example is used to illustrate our proposed method. Copyright (c) 2015 John Wiley & Sons, Ltd.
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页码:1029 / 1040
页数:12
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