Heterodyne Wollaston laser encoder for measurement of in-plane displacement

被引:27
|
作者
Hsieh, Hung-Lin [1 ]
Chen, Wei [1 ]
机构
[1] Natl Taiwan Univ Sci & Technol, Dept Mech Engn, 43 Keelung Rd, Taipei 10607, Taiwan
来源
OPTICS EXPRESS | 2016年 / 24卷 / 08期
关键词
GRATING INTERFEROMETER; SURFACE ENCODER; NONLINEARITY; RESOLUTION;
D O I
10.1364/OE.24.008693
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
This paper reports an innovative heterodyne Wollaston laser encoder with common-optical-path (COP) configuration for the measurement of in-plane displacement. The proposed technique combines the design concepts underlying heterodyne interferometry, grating interferometry, and COP configuration. According to the measurement principle, displacement information pertaining to a moving grating can be obtained from variations in the optical phase induced by the grating. Several experiments were performed to evaluate the feasibility and performance of the proposed heterodyne Wollaston laser encoder. Experiment results demonstrate that the proposed method is capable of sensing in-plane displacement to a resolution of 2 nm while maintaining the stability of the system against environmental disturbances. (C) 2016 Optical Society of America
引用
收藏
页码:8693 / 8707
页数:15
相关论文
共 50 条
  • [21] Pattern evaluation for in-plane displacement measurement of thin films
    Thota, P
    Leifer, J
    Smith, SW
    Lumpp, J
    EXPERIMENTAL MECHANICS, 2005, 45 (01) : 18 - 26
  • [22] Improved digital image correlation for in-plane displacement measurement
    Mudassar, Asloob Ahmad
    Butt, Saira
    APPLIED OPTICS, 2014, 53 (05) : 960 - 970
  • [23] In-plane displacement measurement using a photorefractive speckle correlator
    Tripathi, R
    Pati, GS
    Kumar, A
    Singh, K
    OPTICS COMMUNICATIONS, 1998, 149 (4-6) : 355 - 365
  • [24] The Extension of the Electronic Speckle Photography to the Measurement of In-Plane Displacement
    Mohamed Abdel Hady
    Niveen Abdel Maaboud
    Mohamed El Okr
    Mohamed El Bahrawi
    MAPAN, 2018, 33 : 377 - 384
  • [25] IN-PLANE DISPLACEMENT MEASUREMENT OF COMPOSITE MATERIAL BY OBJECTIVE SPECKLE
    Mao Tienxiang Han Jinhu Li Chunxiu Zou Rongda (Institute of Mechanics
    Acta Mechanica Sinica, 1987, (03) : 291 - 297
  • [26] A Wollaston Prism and Corner Cube Reflector Cooperative Sensing Heterodyne Interferometer for Simultaneous Measurement of Straightness Errors and Displacement
    Yan, Liping
    Chen, Yu
    Lou, Yingtian
    Xie, Jiandong
    Chen, Benyong
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2024, 73
  • [27] Dynamic measurement of large displacement using heterodyne laser interferometry
    Takahashi, Yasuhide
    Akizuki, Keisaku
    Kiso, Mataichiro
    Murase, Seiichi
    Hasegawa, Naoki
    Seimitsu Kogaku Kaishi/Journal of the Japan Society for Precision Engineering, 1998, 64 (08): : 1132 - 1136
  • [28] Laser heterodyne measurement of photothermal displacement for material surface characterization
    Pencheva, V
    Penchev, S
    Naboko, V
    Donchev, T
    Kolev, S
    Kutzarova, T
    PLASMA PROCESSES AND POLYMERS, 2006, 3 (02) : 253 - 256
  • [29] Out-of-plane displacement measurement by electronic speckle pattern interferometry in presence of large in-plane displacement
    Martínez-Celorio, RA
    Barrientos, B
    Sanchez-Marín, FJ
    López, LM
    Rayas, JA
    OPTICS COMMUNICATIONS, 2002, 208 (1-3) : 17 - 24
  • [30] A displacement measurement system, utilizing a Wollaston interferometer
    Kemp, J
    Jiang, XQ
    Ning, YN
    Palmer, AW
    Grattan, KTV
    OPTICS AND LASER TECHNOLOGY, 1998, 30 (01): : 71 - 75