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- [1] Forming-Free Resistive Switching Memory Characteristics Using IrOx/GdOx/W Cross-bar Structure DIELECTRICS FOR NANOSYSTEMS 5: MATERIALS SCIENCE, PROCESSING, RELIABILITY, AND MANUFACTURING -AND-TUTORIALS IN NANOTECHNOLOGY: MORE THAN MOORE - BEYOND CMOS EMERGING MATERIALS AND DEVICES, 2012, 45 (03): : 349 - 354
- [2] Enhanced resistive switching phenomena using low-positive-voltage format and self-compliance IrOx/GdOx/W cross-point memories NANOSCALE RESEARCH LETTERS, 2014, 9 : 1 - 8
- [3] Enhanced resistive switching phenomena using low-positive-voltage format and self-compliance IrOx/GdOx/W cross-point memories Nanoscale Research Letters, 9
- [5] Rough surface improved formation-free low power resistive switching memory using IrOx/GdOx/W structure 2013 INTERNATIONAL SYMPOSIUM ON VLSI TECHNOLOGY, SYSTEMS, AND APPLICATIONS (VLSI-TSA), 2013,
- [9] Self-compliance-improved resistive switching using Ir/TaOx/W cross-point memory Nanoscale Research Letters, 8
- [10] Self-compliance-improved resistive switching using Ir/TaOx/W cross-point memory NANOSCALE RESEARCH LETTERS, 2013, 8 : 1 - 6