Low temperature ageing behaviour of quenched Cu-Al-Be shape memory alloy

被引：4
|
作者：
Planes, A
Manosa, L
Jurado, MA
Romero, R
Somoza, A
机构：
[1] Univ Barcelona, Fac Fis, Dept Estructura & Constituents Mat, E-08028 Barcelona, Catalonia, Spain
[2] Univ Nacl, Ctr Prov Buenos Aires, IFIMAT, RA-7000 Tandil, Argentina
[3] Comis Invest Cient Prov Buenos Aires, La Plata, Buenos Aires, Argentina
来源：
JOURNAL DE PHYSIQUE IV | 1997年 / 7卷 / C5期
关键词：
D O I：
10.1051/jp4:1997548
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
Positron lifetime measurements are used to obtain the concentration of quenched-in Feint defects for different quenching temperatures and to determine their subsequent time evolution at room temperature, The corresponding: evolution of the transition temperature after the quench has also been measured by calorimetry. The fact that both quantities follow comparable time evolutions corroborates the claim that vacancies are responsible for the observed changes in the martensitic transition properties after quenching.
引用
收藏
页码：305 / 310
页数：6
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