Use of an asymmetric pulse profile for higher crystalline volumes from excimer laser crystallization of amorphous silicon

被引:9
|
作者
Adikaari, A. A. D. T. [1 ]
Mudugamuwa, N. K. [1 ]
Silva, S. R. P. [1 ]
机构
[1] Univ Surrey, Nano Elect Ctr, Adv Technol Inst, Surrey GU2 7XH, England
基金
英国工程与自然科学研究理事会;
关键词
D O I
10.1063/1.2731664
中图分类号
O59 [应用物理学];
学科分类号
摘要
An excimer laser is used to crystallize amorphous silicon on glass to nanocrystalline silicon, yielding higher crystalline volumes than reported earlier, by modifying the laser pulse profile used for crystallization at a given energy density. An asymmetric, shorter pulse profile, as opposed to the conventional Gaussian profile retains the desirable gradual leading edge of the Gaussian pulse for controlled evolution of hydrogen, while increasing the peak energy. The resultant films show an increased surface roughness along with higher crystalline volumes, which may be beneficial for photovoltaics and electron field emission cold cathodes. (c) 2007 American Institute of Physics.
引用
收藏
页数:3
相关论文
共 50 条
  • [21] The mechanism of amorphous silicon thin films using XeF excimer laser crystallization
    Kuo, C. C.
    Yeh, W. C.
    Hsiao, C. P.
    Jeng, J. Y.
    PROCEEDINGS OF THE 35TH INTERNATIONAL MATADOR CONFERENCE: FORMERLY THE INTERNATIONAL MACHINE TOOL DESIGN AND RESEARCH CONFERENCE, 2007, : 25 - +
  • [22] Recrystallization mechanism of amorphous silicon thin films upon excimer laser crystallization
    Kuo, Chil-Chyuan
    Yeh, Wen-Chang
    Hsiao, Chih-Ping
    Jeng, Jeng-Ywan
    JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 2007, 9 (07): : 2023 - 2029
  • [23] Recrystallization mechanism of amorphous silicon thin films upon excimer laser crystallization
    Kuo, Chil-Chyuan
    Yeh, Wen-Chang
    Hsiao, Chih-Ping
    Jeng, Jeng-Ywan
    OPTOELECTRONICS AND ADVANCED MATERIALS-RAPID COMMUNICATIONS, 2007, 1 (01): : 25 - 30
  • [24] Selective area excimer-laser crystallization of amorphous silicon thin films
    Viatella, J
    Lee, SM
    Singh, RK
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1999, 146 (12) : 4605 - 4610
  • [25] CRYSTALLIZATION OF AMORPHOUS-SILICON BY EXCIMER-LASER ANNEALING WITH A LINE-SHAPE BEAM HAVING A GAUSSIAN PROFILE
    JHON, YH
    KIM, DH
    CHU, H
    CHOI, SS
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1994, 33 (10B): : L1438 - L1441
  • [26] Properties of hydrogenated amorphous silicon carbide films irradiated by excimer pulse laser
    Wang, L
    Ma, TF
    Huang, XF
    Xu, J
    Li, QL
    Wu, ZC
    Chen, KJ
    ACTA PHYSICA SINICA-OVERSEAS EDITION, 1998, 7 (12): : 930 - 935
  • [27] Fabrication of crystalline silicon nanowires coated with graphene from graphene oxide on amorphous silicon substrate using excimer laser
    Aziz, Christen
    Othman, Muhammad A.
    Amer, Aya
    Ghanim, AbdelRahman M.
    Swillam, Mohamed A.
    HELIYON, 2024, 10 (13)
  • [28] Two-pass excimer laser annealing process to control amorphous silicon crystallization
    Istituto di Elettronica dello Stato, Solido, Roma, Italy
    Jpn J Appl Phys Part 2 Letter, 8 B (L907-L910):
  • [29] A two-pass excimer laser annealing process to control amorphous silicon crystallization
    Mariucci, L
    Carluccio, R
    Pecora, A
    Foglietti, V
    Fortunato, G
    Della Sala, D
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1999, 38 (8B): : L907 - L910
  • [30] Crystallization of Amorphous Silicon via Excimer Laser Annealing and Evaluation of Its Passivation Properties
    Chowdhury, Sanchari
    Park, Jinsu
    Kim, Jaemin
    Kim, Sehyeon
    Kim, Youngkuk
    Cho, Eun-Chel
    Cho, Younghyun
    Yi, Junsin
    ENERGIES, 2020, 13 (13)