A dynamic element matching approach to ADC testing

被引：0
|
作者：
Olleta, B [1 ]
Chen, DG [1 ]
Geiger, R [1 ]
机构：
[1] Iowa State Univ Sci & Technol, Dept Elect & Comp Engn, Ames, IA 50011 USA
来源：
2002 45TH MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL II, CONFERENCE PROCEEDINGS | 2002年
关键词：
D O I：
暂无
中图分类号：
TP18 [人工智能理论];
学科分类号：
081104 ; 0812 ; 0835 ; 1405 ;
摘要：
A dynamic element matching approach to ADC testing is presented. With this technique a highly nonideal DAC is used to generate an excitation for the DUT. Dynamic element matching is used to create a statically precise excitation from imprecise components. Simulation results show this approach can be used to accurately measure the performance of an ADC. This technique offers potential for use in both production test and BIST environments.
引用
收藏
页码：549 / 552
页数：4
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