3-D Scanning Mid-IR Imaging of Buried Structures Using Extremely Nondegenerate Two-photon Absorption in a GaN Photodiode

被引：0
|
作者：
Pattanaik, Himansu S. [1 ]
Reichert, Matthew
Hagan, David J.
Van Stryland, Eric W.
机构：
[1] Univ Cent Florida, CREOL, Coll Opt & Photon, 4304 Scorpius St, Orlando, FL 32816 USA
来源：
2015 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) | 2015年
关键词：
D O I：
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We demonstrate a scanning 3-D IR imaging technique using extremely nondegenerate two-photon absorption in an uncooled GaN photodiode, and obtain similar to 2 mu m depth resolution at a wavelength of similar to 5 mu m in buried semiconductor structures.
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页数：2
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