A Study on the Electric Characteristics of the Trench Gate Field Stop Insulated Gate Bipolar Transistor Through Two-Step Field Stop

被引:0
|
作者
Lee, Hae Seock [1 ]
Lee, Geon Hee [1 ]
Ahn, Byoung Sup [1 ]
Kang, Ey Goo [1 ]
机构
[1] Far East Univ, Dept Energy IT Engn, Eumseong 369700, South Korea
关键词
Power Semiconductor; IGBT; Trench Gate; Two-Step Field Stop;
D O I
10.1166/jno.2021.3005
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Insulated gate bipolar transistor (IGBT) element is an electrically conductive device with Bipolar junction transistor (BJT) output and Metal Oxide Silicon Field Effect Transistor (MOSFET) input. The IGBTs is a power semiconductor device that aims for high breakdown voltage, low on-state voltage, fast switching and reliability. This paper is, the experiment was conducted with a two-step field stop, IGBT instead of a traditional one step field stop. In order to minimize the energy loss caused by the trade-off relationship between breakdown voltage and the on-state voltage drop, the experiment was conducted by forming a two-step field stop. Through concentration control between steps, breakdown voltage, On-state Voltage drop and turn off time could be adjusted in detail, and efficient characteristic values could be obtained accordingly. Experiments have confirmed that the On state voltage drop and turn-off time, in particular, can be adjusted by small failure voltage loss upon change in the first stage field stop.
引用
收藏
页码:762 / 765
页数:4
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