Key Technology Research On anti-High Overload Electronic Recorder

被引:0
|
作者
Wen Feng [1 ]
Yang Zhiyong [1 ]
机构
[1] N Univ China, Natl Key Lab Elect Measurement Technol, Taiyuan 030051, Shanxi, Peoples R China
关键词
Anti-high overload; FLASH memory; FPGA; Reliability;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Anti-high overload electronic data recorder is used to record overload parameters of the penetration process, the flying posture parameters of the bomblets, the remote metering data of the missile and other important parameters. It is of great significance because it can provide a theoretical basis for weapon systems' development and improvement. However how electronic data recorder can withstand the impaction overload of the blast or even the armor-piercing is the most important Prere- quisite for shell-containing recorders to access data. The cost of weapon systems test is very expensive, so high reliability of the electronic data recorder is required. In this paper based on dynamic testing technology, we presented a high reliability key technology for anti-high overload electronic recorder with FLASH memory, FPGA-based controller and multi-channel high-speed A/D converter.
引用
收藏
页码:27 / 30
页数:4
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