Ultrafast Threshold Switching Dynamics in Phase-Change Materials

被引:8
|
作者
Saxena, Nishant [1 ]
Manivannan, Anbarasu [1 ]
机构
[1] Indian Inst Technol Madras, Adv Memory & Comp Grp, Phase Change Memory Lab, Dept Elect Engn, Chennai 600036, Tamil Nadu, India
来源
PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS | 2022年 / 16卷 / 09期
关键词
chalcogenide glasses; nonvolatile memory; Ovonic threshold switching (OTS) selector; phase-change materials; threshold switching; MEMORY; STATES; SPEED; GAP; TRANSITIONS; CONDUCTION; DEVICE; MODEL; FILMS;
D O I
10.1002/pssr.202200101
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Discovery of electrical switching in chalcogenide glasses by S.R. Ovshinsky paves a new path for developing high-speed nonvolatile electronic memory and high-performance computing solutions. This article presents a review on the systematic understanding of threshold switching (TS) properties in various chalcogenide materials, Ovonic threshold switching (OTS) and Ovonic memory switching (OMS), the nature of TS, voltage-dependent transient characteristics, and the role of TS in governing the programming speed based on research efforts over the last six decades. Furthermore, realization of TS in picosecond timescale, the commonalities between OTS and OMS, and the possible underlying mechanism has been explored. Furthermore, a scheme of material classification based on TS dynamics for ultrafast yet energy-efficient programming has been proposed for phase-change memory with SRAM-like programming speed for future electronics.
引用
收藏
页数:10
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