CORRELATING OP-AMP CIRCUIT NOISE WITH DEVICE FLICKER (1/f) NOISE FOR ANALOG DESIGN APPLICATIONS

被引：0
|
作者：
Srinivasan, P. [1 ]
Marshall, A. [1 ]
机构：
[1] Texas Instruments Inc, Technol Design Integrat, Dallas, TX 75243 USA
来源：
IEEE INTERNATIONAL SOC CONFERENCE, PROCEEDINGS | 2009年
关键词：
D O I：
10.1109/SOCCON.2009.5398062
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Component noise is becoming more of an issue as device sizes reduce. Using a 45nm CMOS process we evaluate a method to correlate noise in operational amplifiers with transistor noise at low-frequencies. This reduces test time, and provides an alternative method to characterize and model 1/f noise of individual devices.
引用
收藏
页码：191 / 194
页数：4
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