1/f noise of the RoxTM sensor

被引：1

作者：

Ptak, Piotr ^{[1
]}

Kolek, Andrzej ^{[1
]}

Zawislak, Zbigniew ^{[1
]}

Stadler, Adam W. ^{[1
]}

Mleczko, Krzysztof ^{[1
]}

机构：

[1] Rzeszow Univ Technol, Dept Elect Fundamentals, PL-35959 Rzeszow, Poland

来源：

SENSORS AND ACTUATORS A-PHYSICAL | 2007年 / 137卷 / 01期

关键词：

1/f noise; temperature sensor; temperature measurement resolution; thick film resistor;

D O I：

10.1016/j.sna.2007.02.034

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

I/f noise was measured for LakeShore RX-202A resistance temperature sensor. Its intensity increases significantly when the temperature is lowered below a few kelvin. It is shown that this rise in the noise intensity leads to the decrease in the temperature measurement resolution. For the lowest temperatures it is limited to 0.01 % only. A source of such large noise is the resistive layer of the sensor. To prove it, multi-terminal lab-made RuO2 + glass thick film samples were prepared and measurements, that allow discrimination between contact and bulk components of the sensor noise, were made. (C) 2007 Elsevier B.V. All rights reserved.

引用

页码：51 / 56

页数：6

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