Mechanical scanning of the specmen in the scanning electron microscope

被引:0
|
作者
Oho, E [1 ]
Miyamoto, M [1 ]
机构
[1] Kogakuin Univ, Dept Elect Engn, Hachioji, Tokyo 1920015, Japan
关键词
ultra-low magnification; mechanical scanning; digital image processing; scanning electron microscope; personal computer-scanning electron microscope;
D O I
暂无
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A scanning electron microscope (SEM) system equipped with a motor drive specimen stage fully controlled with a personal computer (PC) has been utilized for obtaining ultralow magnification SEM images. This modern motor drive stage works as a mechanical scanning device. To produce ultra-low magnification SEM images, we use a successful combination of the mechanical scanning, electronic scanning, and digital image processing techniques. This new method is extremely labor and time saving for ultra-low magnification and wide-area observation. The option of ultra-low magnification observation (while maintaining the original SEM functions and performance) is important during a scanning electron microscopy session.
引用
收藏
页码:250 / 255
页数:6
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