δ-doping InGaP/GaAs heterojunction bipolar transistor

被引:1
|
作者
Chen, JY [1 ]
Cheng, SY [1 ]
Chang, WL [1 ]
Liu, WC [1 ]
机构
[1] Natl Cheng Kung Univ, Dept Elect Engn, Tainan 70101, Taiwan
关键词
heterojunction bipolar transistor; delta-doped layer; potential spike; collector-emitter offset voltage; ideality factor;
D O I
10.1016/S0254-0584(97)02066-X
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
An InGaP/GaAs heterojunction bipolar transistor with a 50 Angstrom undoped spacer and delta-doping sheet at base-emitter heterointerface is fabricated and studied, A common-emitter current gain of 280 and an offset voltage as small as 55 mV are obtained, respectively. These results shows that high current gain and low offset voltage can be attained simultaneously without the passivation of the emitter-base junction. The experimental results show that the potential spike is reduced by the employment of a delta-doped layer simultaneously. On the contrary, theoretical consideration also shows that the potential spike vanishes by inserting a delta-doping sheet between the emitter-base heterointerface. (C) 1998 Elsevier Science S.A.
引用
收藏
页码:88 / 91
页数:4
相关论文
共 50 条
  • [31] InGaP/GaAs/InGaP composite collector double heterojunction bipolar transistor with high breakdown, low offset, and knee voltage
    Lew, KL
    Zhang, R
    Yoon, SF
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2004, 22 (02): : 579 - 582
  • [32] Temperature dependence of InGaP/GaAs heterojunction bipolar transistor DC and small-signal behavior
    Ahmari, DA
    Raghavan, G
    Hartmann, QJ
    Hattendorf, ML
    Feng, M
    Stillman, GE
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1999, 46 (04) : 634 - 640
  • [34] InGaP/GaAs heterojunction bipolar transistor grown on Si substrate with SiGe graded buffer layer
    Lew, K. L.
    Yoon, S. F.
    Tanoto, H.
    Chen, K. P.
    Dohrman, C. L.
    Isaacson, D. M.
    Fitzgerald, E. A.
    ELECTRONICS LETTERS, 2008, 44 (03) : 243 - U25
  • [35] Design consideration of emitter-base junction structure for InGaP/GaAs heterojunction bipolar transistor
    Natl Cheng-Kung Univ, Tainan, Taiwan
    Conf Optoelectron Microelectron Mater Dev Proc COMMAD, (246-248):
  • [36] Effect of composite collector design on the breakdown behavior of InGaP/GaAs double heterojunction bipolar transistor
    Lew, KL
    Yoon, SF
    JOURNAL OF APPLIED PHYSICS, 2003, 93 (01) : 605 - 610
  • [37] Raman characterization of GaAs/InGaP heterostructure bipolar transistor
    Amtout, A
    Ferguson, I
    Lee, DS
    Sun, SZ
    Armour, EA
    Cooke, P
    Stall, RA
    2001 IEEE INTERNATIONAL SYMPOSIUM ON COMPOUND SEMICONDUCTORS, 2000, : 25 - 30
  • [38] Reliability investigation of InGaP/GaAs heterojunction bipolar transistors
    Bahl, SR
    Camnitz, LH
    Houng, D
    Mierzwinski, M
    IEEE ELECTRON DEVICE LETTERS, 1996, 17 (09) : 446 - 448
  • [39] Annealing study of InGaP/GaAs heterojunction bipolar transistor and carbon-doped p+GaAs base layers
    Moriarty, GR
    Murtagh, M
    Cherkaoui, K
    Gouez, G
    Kelly, PV
    Crean, GM
    Bland, SW
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 2001, 80 (1-3): : 284 - 288
  • [40] An X-band carbon-doped InGaP/GaAs heterojunction bipolar transistor MMIC oscillator
    Kim, YG
    Kim, CW
    Kim, SI
    Min, BG
    Lee, JM
    Lee, KH
    ETRI JOURNAL, 2005, 27 (01) : 75 - 80