Pressure dependence of the refractive index in InSe

被引:12
|
作者
Manjón, FJ
van der Vijver, Y
Segura, A
Muñoz, V
机构
[1] Univ Valencia, Inst Ciencia Mat, E-46100 Valencia, Spain
[2] Univ Valencia, Dept Fis, E-46100 Valencia, Spain
关键词
D O I
10.1088/0268-1242/15/8/304
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this work we report on the pressure dependence of the refractive index of indium selenide (InSe) for polarization perpendicular to the c-axis (E perpendicular to c). The refractive index dispersion n perpendicular to(omega) of InSe has been measured between 0.77 and 1.5 eV for hydrostatic pressures up to 8 GPa and interpreted through a single oscillator Phillips-van Vechten model yielding the electronic refractive index and dielectric function. This model also yields the pressure dependence of the Penn gap in InSe, whose interlayer and intralayer deformation potentials have been obtained and compared with those of the lower energy optical gaps. The possible electronic transitions responsible for the Penn gaps for both polarizations (perpendicular and parallel to the c-axis) in InSe and other III-VI layered materials are also discussed on the basis of recent band structure calculations.
引用
收藏
页码:806 / 812
页数:7
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