Prospects of photoresists for ArF immersion lithography.

被引:0
|
作者
Conley, W [1 ]
机构
[1] Int Sematech, Litog Div, Austin, TX 78741 USA
来源
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 2004年 / 228卷
关键词
D O I
暂无
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
79-PMSE
引用
收藏
页码:U427 / U427
页数:1
相关论文
共 50 条
  • [41] RESISTS USED IN LITHOGRAPHY.
    Roberts, Edward D.
    Chemistry and Industry (London), 1985, (08): : 251 - 257
  • [42] Development of ArF photoresists
    Koshiba, Mitsunobu
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2014, 248
  • [43] HORACE VERNET AND LITHOGRAPHY.
    Szrajber, Tanya
    PRINT QUARTERLY, 2018, 35 (01) : 80 - 82
  • [44] Characterization of photoresists for ArF-excimer laser lithography using monoenergetic positron beams
    Uedono, A
    Ohdaira, T
    Suzuki, R
    Mikado, T
    Fukui, S
    Kimura, S
    Miyamoto, H
    Nemoto, H
    JOURNAL OF POLYMER SCIENCE PART B-POLYMER PHYSICS, 2004, 42 (02) : 341 - 346
  • [45] CONTRAST ENHANCED LITHOGRAPHY.
    Griffing, Bruce F.
    West, Paul R.
    1600, (28):
  • [46] ArF half-tone PSM cleaning process optimization for next-generation lithography.
    Son, YS
    Jeong, SH
    Kim, JB
    Kim, HS
    PHOTOMASK AND NEXT-GENERATION LITHOGRAPHY MASK TECHNOLOGY VII, 2000, 4066 : 416 - 424
  • [47] LWR reduction in low k1 ArF immersion lithography
    Matsunaga, Kentaro
    Oori, Tomoya
    Kato, Hirokazu
    Kawamura, Daisuke
    Shiobara, Eishi
    Inatomi, Yuichiro
    Kawasaki, Tetsu
    Iwashita, Mitsuaki
    Ito, Shinichi
    ADVANCES IN RESIST MATERIALS AND PROCESSING TECHNOLOGY XXV, PTS 1 AND 2, 2008, 6923
  • [48] Impact of the absorber thickness variation on the imaging performance of ArF immersion lithography
    Yoshizawa, M
    Philipsen, V
    Leunissen, LHA
    Photomask and Next-Generation Lithography Mask Technology XII, Pts 1 and 2, 2005, 5853 : 243 - 251
  • [49] High refractive index fluid for next generation ArF immersion lithography
    Furukawa, Taiichi
    Hieda, Katsuhiko
    Wang, Yong
    Miyamatsu, Takashi
    Yamada, Kinji
    Tominaga, Tetsuo
    Makita, Yutaka
    Nakagawa, Hiroki
    Nakamura, Atsushi
    Shima, Motoyuki
    Shimokawa, Tsutomu
    JOURNAL OF PHOTOPOLYMER SCIENCE AND TECHNOLOGY, 2006, 19 (05) : 641 - 646
  • [50] High Reliability ArF Light Source for Double Patterning Immersion Lithography
    Rokitski, Rostislav
    Ishihara, Toshi
    Rao, Rajeskar
    Jiang, Rui
    Haviland, Mary
    Cacouris, Theodore
    Brown, Daniel
    OPTICAL MICROLITHOGRAPHY XXIII, 2010, 7640