The Art of Certifying Analog/Mixed-Signal Circuits

被引：0
|
作者：
Li, Peng [1 ]
机构：
[1] Texas A&M Univ, Dept Elect & Comp Engn, College Stn, TX USA
来源：
IEEE DESIGN & TEST | 2015年 / 32卷 / 01期
关键词：
Analog circuits; Integrated circuit modeling; Scalability; Formal verification;
D O I：
10.1109/MDAT.2014.2370852
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：79 / 80
页数：2
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