Two-dimensional measurement of focused hard X-ray beam profile using coherent X-ray diffraction of isolated nanoparticle

被引：1
|
作者：
Takahashi, Yukio [1 ]
Kubo, Hideto [2 ]
Tsutsumi, Ryosuke [2 ]
Sakaki, Shigeyuki [2 ]
Zettsu, Nobuyuki [3 ]
Nishino, Yoshinori [4 ]
Ishikawa, Tetsuya [4 ]
Yamauchi, Kazuto [2 ,3 ]
机构：
[1] Osaka Univ, Grad Sch Engn, Frontier Res Ctr, Frontier Res Base Global Young Researchers, Suita, Osaka 5650871, Japan
[2] Osaka Univ, Grad Sch Engn, Dept Precis Sci & Technol, Suita, Osaka 5650871, Japan
[3] Osaka Univ, Grad Sch Engn, Res Ctr Ultraprecis Sci & Technol, Suita, Osaka 5650871, Japan
[4] RIKEN SPring 8 Ctr, Sayo, Hyogo 6795148, Japan
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2010年 / 616卷 / 2-3期
关键词：
X-ray beam diagnosis; X-ray mirror; Coherent X-ray diffraction microscopy; Silver nanocube; PHASE RETRIEVAL; ALGORITHM;
D O I：
10.1016/j.nima.2009.10.159
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
A method for evaluating the two-dimensional photon density distribution in focused hard X-ray beams is proposed and demonstrated in a synchrotron experiment at SPring-8. A synchrotron X-ray beam of 11.8 key is focused to a similar to 1 mu m spot by Kirkpatrick-Baez mirrors. The two-dimensional intensity distribution of the focused beam is derived by monitoring the forward diffracted intensity from an isolated silver nanocube with an edge length of similar to 150 nm positioned in the beam waist, which is two-dimensionally scanned. Furthermore, the photon density of X-rays illuminated onto the nanocube is estimated by utilizing coherent X-ray diffraction microscopy. This method is useful for evaluating the photon density distribution of hard X-ray beams focused to a spot size of less than a few micrometers. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码：266 / 269
页数：4
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