A Model for Surface Defect Detection of Industrial Products Based on Attention Augmentation

被引:10
|
作者
Li, Gang [1 ]
Shao, Rui [1 ]
Wan, Honglin [2 ]
Zhou, Mingle [1 ]
Li, Min [1 ]
机构
[1] Qilu Univ Technol, Shandong Acad Sci, Shandong Comp Sci Ctr, Jinan 250014, Peoples R China
[2] Shandong Normal Univ, Sch Phys & Elect Sci, Jinan 250014, Peoples R China
关键词
Object detection - High speed cameras - Image enhancement;
D O I
10.1155/2022/9577096
中图分类号
Q [生物科学];
学科分类号
07 ; 0710 ; 09 ;
摘要
Detecting product surface defects is an important issue in industrial scenarios. In the actual scene, the shooting angle and the distance between the industrial camera and the shooting object often vary, which results in a large variation in the scale and angle. In addition, high-speed cameras are prone to motion blur, which further deteriorates the defect detection results. In order to solve the above problems, this study proposes a surface defect detection model for industrial products based on attention enhancement. The network takes advantage of the lower-level and higher-resolution feature map from the backbone to improve Path Aggregation Network (PANet) in object detection. This study makes full use of multihead self-attention (MHSA), an independent attention block for enhancing the backbone network, which has made considerable progress for practical application in industry and further improvement of the surface defect detection. Moreover, some tricks have been adopted that can improve the detection performance, such as data augmentation, grayscale filling, and channel conversion of input images. Experiments in this study on internal datasets and four public datasets demonstrate that our model has achieved good performance in industrial scenarios. On the internal dataset, the mAP@.5 result of our model is 98.52%. In the RSDDs dataset, the model in this study achieves 86.74%. In the BSData dataset, the model reaches 82.00%. Meanwhile, it achieves 81.09% and 74.67% on the NRSD-MN and NEU-DET datasets, respectively. This study has demonstrated the effectiveness and certain generalization ability of the model from internal datasets and public datasets.
引用
收藏
页数:12
相关论文
共 50 条
  • [31] Attention-based deep learning for chip-surface-defect detection
    Wang, Shuo
    Wang, Hongyu
    Yang, Fan
    Liu, Fei
    Zeng, Long
    INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, 2022, 121 (3-4): : 1957 - 1971
  • [32] A lightweight detector based on attention mechanism for aluminum strip surface defect detection
    Ma, Zhuxi
    Li, Yibo
    Huang, Minghui
    Huang, Qianbin
    Cheng, Jie
    Tang, Si
    COMPUTERS IN INDUSTRY, 2022, 136
  • [33] Attention-based deep learning for chip-surface-defect detection
    Shuo Wang
    Hongyu Wang
    Fan Yang
    Fei Liu
    Long Zeng
    The International Journal of Advanced Manufacturing Technology, 2022, 121 : 1957 - 1971
  • [34] RETRACTED: Surface Defect Detection Method Based on Improved Attention Mechanism and Feature Fusion Model (Retracted Article)
    Chen, Yongbin
    Wang, Guitang
    Fu, Qinshen
    COMPUTATIONAL INTELLIGENCE AND NEUROSCIENCE, 2022, 2022
  • [35] A drift detection method for industrial images based on a defect segmentation model
    Li, Weifeng
    Li, Bin
    Wang, Zhenrong
    Qiu, Chaochao
    Niu, Shuanlong
    Tan, Xin
    Niu, Tongzhi
    KNOWLEDGE-BASED SYSTEMS, 2024, 301
  • [36] Surface defect detection method for electronic panels based on attention mechanism and dual detection heads
    Wang, Le
    Huang, Xixia
    Zheng, Zhangjing
    PLOS ONE, 2023, 18 (01):
  • [37] Surface Flaw Detection of Industrial Products Based on Convolutional Neural Network
    Zhang, Yongjun
    Wang, Ziliang
    2018 4TH INTERNATIONAL CONFERENCE ON ENVIRONMENTAL SCIENCE AND MATERIAL APPLICATION, 2019, 252
  • [38] A hierarchical attention detector for bearing surface defect detection
    Ma, Jiajun
    Hu, Songyu
    Fu, Jianzhong
    Chen, Gui
    EXPERT SYSTEMS WITH APPLICATIONS, 2024, 239
  • [39] Vision sensing based intelligent detection of surface defect and its industrial applications
    Chai L.
    Ren L.
    Gu K.
    Chen J.
    Huang B.
    Ye Q.
    Cao W.
    Jisuanji Jicheng Zhizao Xitong/Computer Integrated Manufacturing Systems, CIMS, 2022, 28 (07): : 1996 - 2004
  • [40] ICA-Net: Industrial defect detection network based on convolutional attention and of multiscale features
    Zhao, ShiLong
    Li, Gang
    Zhou, MingLe
    Li, Min
    ENGINEERING APPLICATIONS OF ARTIFICIAL INTELLIGENCE, 2023, 126