Perpendicular magnetic anisotropy and its electrical control in FeNiB ultrathin films

被引:2
|
作者
Yamamoto, Tatsuya [1 ]
Nozaki, Takayuki [1 ]
Yakushiji, Kay [1 ]
Tamaru, Shingo [1 ]
Kubota, Hitoshi [1 ]
Fukushima, Akio [1 ]
Yuasa, Shinji [1 ]
机构
[1] Natl Inst Adv Ind Sci & Technol, Res Ctr Emerging Comp Technol, Tsukuba, Ibaraki 3058568, Japan
关键词
The authors thank T. Nozaki; M; Konoto; A; Sugihara; S; Tsunegi; Y; Hibino; Endo; H; Ohmori; Higo; Kageyama; and M. Hosomi for their fruitful discussions; and E. Usuda and M. Toyoda for assisting with the experiments. This work was based on the results obtained from a project; Grant No. JPNP16007; commissioned by the New Energy and Industrial Technology Development Organization (NEDO); Japan;
D O I
10.1063/5.0033283
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We study the perpendicular magnetic anisotropy in (Fe100-xNix)(80)B-20 (FeNiB) films with various Ni contents. Perpendicularly magnetized films are achieved when the Ni content is in the range of 30 at.%-70 at.%. An effective perpendicular magnetic anisotropy (PMA) constant of 1.1x 10(5) J/m(3) is achieved for the (Fe50Ni50)(80)B-20 film. We also fabricate magnetic tunnel junction devices containing FeNiB films, and electrical measurements show that a tunneling magnetoresistance ratio of more than 20% can be achieved for devices having an orthogonal magnetization configuration. The PMA of the FeNiB film clearly changes by varying the bias voltage applied along the FeNiB/MgO junction, and a voltage-controlled magnetic anisotropy (VCMA) efficiency of over 30 fJ/Vm is demonstrated. From systematic investigations, there is no clear correlation between PMA and VCMA efficiency in the FeNiB/MgO junction. These experimental results should facilitate the development of energy-efficient magnetic random-access memory.
引用
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页数:4
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