On-chip all-dielectric fabrication-tolerant zero-index metamaterials

被引:31
|
作者
Kita, Shota [1 ]
Li, Yang [1 ]
Camayd-Munoz, Philip [1 ]
Reshef, Orad [1 ]
Vulis, Daryl I. [1 ]
Day, Robert W. [2 ]
Mazur, Eric [1 ,3 ]
Loncar, Marko [1 ]
机构
[1] Harvard Univ, John A Paulson Sch Engn & Appl Sci, 9 Oxford St, Cambridge, MA 02138 USA
[2] Harvard Univ, Dept Chem & Chem Biol, 12 Oxford St, Cambridge, MA 02138 USA
[3] Harvard Univ, Dept Phys, 29 Oxford St, Cambridge, MA 02138 USA
来源
OPTICS EXPRESS | 2017年 / 25卷 / 07期
基金
加拿大自然科学与工程研究理事会; 日本学术振兴会; 美国国家科学基金会;
关键词
REFRACTIVE-INDEX; DIRAC CONES; PROPAGATION; REALIZATION;
D O I
10.1364/OE.25.008326
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Zero-index metamaterials (ZIMs) offer unprecedented ways to manipulate the flow of light, and are of interest for wide range of applications including optical cloaking, supercoupling, and unconventional phase-matching properties in nonlinear optics. Impedancematched ZIMs can be obtained through a photonic Dirac-cone (PDC) dispersion induced by an accidental degeneracy of an electric monopole and a transverse magnetic dipole mode at the center of the Brillouin zone. Therefore, PDC is very sensitive to fabrication imperfections. In this work, we propose and demonstrate fabrication-tolerant all-dielectric ZIM in telecom regime that supports near PDC dispersion over much wider parameter space than conventional designs. The prism device integrated with Si photonics is fabricated and measured for the verification. (C) 2017 Optical Society of America
引用
收藏
页码:8326 / 8334
页数:9
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