Special issue on behavioral modeling and simulation of mixed-signal/mixed-technology circuits and systems - Guest editorial

被引:0
|
作者
Mantooth, HA [1 ]
Gielen, GGE
机构
[1] Univ Arkansas, Dept Elect Engn, Fayetteville, AR 72701 USA
[2] Katholieke Univ Leuven, B-3001 Louvain, Belgium
关键词
D O I
10.1109/TCAD.2003.808577
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
引用
收藏
页码:121 / 123
页数:3
相关论文
共 50 条
  • [31] Modeling and simulation for low power in mixed-signal integrated systems
    Gielen, G
    IEEE 1998 CUSTOM INTEGRATED CIRCUITS CONFERENCE - PROCEEDINGS, 1998, : 445 - 449
  • [32] Fault simulation for mixed-signal systems
    Caunegre, P
    Abraham, C
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 1996, 8 (02): : 143 - 152
  • [33] Fault simulation for mixed-signal systems
    Siemens Automotive, Toulouse, France
    J Electron Test Theory Appl JETTA, 2 (143-152):
  • [34] SPECIAL ISSUE ON SIMULATION AND MODELING - GUEST EDITORIAL
    CHAMBERLAIN, SG
    IEEE JOURNAL OF OCEANIC ENGINEERING, 1984, 9 (02) : 61 - 62
  • [35] Special Issue on Analog, Mixed-Signal and RF Testing
    Agrawal, Vishwani D.
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2017, 33 (03): : 275 - 275
  • [36] Device Technology for GaN Mixed-Signal Integrated Circuits
    Chen, Kevin Jing
    Kwan, Alex Man Ho
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2013, 52 (11)
  • [37] Special Issue on Analog, Mixed-Signal and RF Testing
    Agrawal, Vishwani D.
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2018, 34 (03): : 209 - 209
  • [38] Special Issue on Analog, Mixed-Signal and RF Testing
    Agrawal, Vishwani D.
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2016, 32 (04): : 399 - 399
  • [39] Modeling and Simulation of Mixed-Signal Integrated Circuits Based on Verilog-AMS
    Zhu, Lijiao
    Fang, Zhengwu
    2013 2ND INTERNATIONAL SYMPOSIUM ON INSTRUMENTATION AND MEASUREMENT, SENSOR NETWORK AND AUTOMATION (IMSNA), 2013, : 1 - 4
  • [40] Modeling a verification test system for mixed-signal circuits
    Bello, DS
    Tangelder, R
    Kerkhoff, H
    IEEE DESIGN & TEST OF COMPUTERS, 2001, 18 (01): : 63 - 71