Electronic structure of (Ge2Sb2Te5)1-x(In3SbTe2)x investigated by x-ray photoelectron spectroscopy

被引:5
|
作者
Benayad, Anass [1 ]
Kang, YounSeon [2 ]
Shin, Hyun-Joon [3 ]
Kim, Kihong [1 ]
Suh, Dong-Seok [2 ]
Kim, KiJoon [2 ]
Kim, CheolKyu [2 ]
Lee, Tae-Yon [2 ]
Noh, Jin-Seo [2 ]
Lee, JaeCheol [1 ]
Khang, YoonHo [2 ]
机构
[1] Samsung Elect Co Ltd, SAIT, Analyt Engn Grp, Suwon 440600, South Korea
[2] Samsung Elect Co Ltd, SAIT, Semicond Device Lab, Suwon 440600, South Korea
[3] Pohang Univ Sci & Technol, Pohang Accelerator Lab, Pohang 790784, South Korea
关键词
CRYSTAL-STRUCTURE; OPTICAL DISK; THIN-FILMS; PHASE; PHOTOEMISSION; IONICITY; STORAGE; MEMORY; INTE; GETE;
D O I
10.1063/1.3190500
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have investigated the core levels and the valence band of (Ge2Sb2Te5)(1-x)(In3Sb1Te2)(x) quaternary phase system (IGST) by means of x-ray photoelectron spectroscopy. A systematic shift of Sb 3d and Ge 2p core-level peaks toward lower binding energies side was observed with increasing indium amount, whereas the In 3d and Te 3d core peaks showed less change. The Sb 3d and Ge 2p core-level shift is attributed to an increase in the electronic charge of p-electrons dependent of indium amount. The valence band spectra show a distinct change in the sp, configuration with indium concentration change. The change in the local bonding as the indium amount increase has a profound impact on both local atomic arrangement and amorphous-to-crystal line transformation temperature. The difference in the photoemission spectra have been discussed according to a simple structural model suggesting that the Na site in IGST can be occupied by Te, Sb, In, and vacancy, whereas in GST it is occupied only by Te. (C) 2009 American Institute of Physics. [DOI: 10.1063/1.3190500]
引用
收藏
页数:6
相关论文
共 50 条
  • [11] Local structure of amorphous Ag5In5Sb60Te30 and In3SbTe2 phase change materials revealed by X-ray photoelectron and Raman spectroscopic studies
    Sahu, Smriti
    Manivannan, Anbarasu
    Shaik, Habibuddin
    Rao, G. Mohan
    JOURNAL OF APPLIED PHYSICS, 2017, 122 (01)
  • [12] Electronic structure of CeRu2X2 (X=Si,Ge) in the paramagnetic phase studied by soft x-ray ARPES and hard x-ray photoelectron spectroscopy
    Yano, M.
    Sekiyama, A.
    Fujiwara, H.
    Amano, Y.
    Imada, S.
    Muro, T.
    Yabashi, M.
    Tamasaku, K.
    Higashiya, A.
    Ishikawa, T.
    Onuki, Y.
    Suga, S.
    PHYSICAL REVIEW B, 2008, 77 (03)
  • [13] Fermi-level pinning at the interface between metals and nitrogen-doped Ge2Sb2Te5 examined by x-ray photoelectron spectroscopy
    Fang, Lina Wei-Wei
    Zhao, Rong
    Pan, Jisheng
    Zhang, Zheng
    Shi, Luping
    Chong, Tow-Chong
    Yeo, Yee-Chia
    APPLIED PHYSICS LETTERS, 2009, 95 (19)
  • [14] Temperature dependent resonant X-ray diffraction of single-crystalline Ge2Sb2Te5
    Urban, Philipp
    Schneider, Matthias N.
    Erra, Loredana
    Welzmiller, Simon
    Fahrnbauer, Felix
    Oeckler, Oliver
    CRYSTENGCOMM, 2013, 15 (24): : 4823 - 4829
  • [15] A study of the structure of (HfO2)x(Al 2O3)1-x/Si films by X-ray photoelectron spectroscopy
    Kaichev V.V.
    Dubinin Yu.V.
    Smirnova T.P.
    Lebedev M.S.
    Journal of Structural Chemistry, 2011, 52 (3) : 480 - 487
  • [16] A STUDY OF THE STRUCTURE OF (HfO2)x(Al2O3)1-x/Si FILMS BY X-RAY PHOTOELECTRON SPECTROSCOPY
    Kaichev, V. V.
    Dubinin, Yu V.
    Smirnova, T. P.
    Lebedev, M. S.
    JOURNAL OF STRUCTURAL CHEMISTRY, 2011, 52 (03) : 480 - 487
  • [17] Atomic Structure Transformations of C-Doped Ge2Sb2Te5 Using In-Situ X-Ray Scattering
    Langhout, John
    Alverson, Danielle
    Butala, Megan
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2022, 78 : A173 - A173
  • [18] Picosecond strain dynamics in Ge2Sb2Te5 monitored by time-resolved x-ray diffraction
    Fons, Paul
    Rodenbach, Peter
    Mitrofanov, Kirill V.
    Kolobov, Alexander V.
    Tominaga, Junji
    Shayduk, Roman
    Giussani, Alessandro
    Calarco, Raffaella
    Hanke, Michael
    Riechert, Henning
    Simpson, Robert E.
    Hase, Muneaki
    PHYSICAL REVIEW B, 2014, 90 (09):
  • [19] Evaluation of vibrational properties and local structure change during phase transition in Ge2Sb2Te5 and In3SbTe2 phase change materials
    Pathak, Anushmita
    Tanwar, Manushree
    Kumar, Rajesh
    Pandey, Shivendra Kumar
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2022, 37 (10)
  • [20] The structure of the Ge(001)-(2x1) reconstruction investigated with X-ray diffraction
    Torrelles, X
    vanderVegt, HA
    Etgens, VH
    Fajardo, P
    Alvarez, J
    Ferrer, S
    SURFACE SCIENCE, 1996, 364 (03) : 242 - 252