Design automation addresses SoC challenges head on

被引:0
|
作者
De Geus, A [1 ]
机构
[1] Synopsys Inc, Mt View, CA 94043 USA
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:60 / 60
页数:1
相关论文
共 50 条
  • [41] Opportunities and Challenges for High Performance Microprocessor Designs and Design Automation
    Puri, Ruchir
    2013 26TH INTERNATIONAL CONFERENCE ON VLSI DESIGN AND 2013 12TH INTERNATIONAL CONFERENCE ON EMBEDDED SYSTEMS (VLSID), 2013, : XXXV - XXXVI
  • [42] Towards automation of control software: A review of challenges in mechatronic design
    Cabrera, A. A. Alvarez
    Foeken, M. J.
    Tekin, O. A.
    Woestenenk, K.
    Erden, M. S.
    De Schutter, B.
    van Tooren, M. J. L.
    Babuska, R.
    van Houten, F. J. A. M.
    Tomiyama, T.
    MECHATRONICS, 2010, 20 (08) : 876 - 886
  • [43] Automation challenges
    Castro, JA
    SOLID STATE TECHNOLOGY, 1997, 40 (05) : 20 - 20
  • [44] Design Flow Automation for Silicon Photonics: Challenges, Collaboration, and Standardization
    Heins, Mitchell
    Cone, Chris
    Ferguson, John
    Cao, Ruping
    Pond, James
    Klein, Jackson
    Korthorst, Twan
    Bakker, Arjen
    Stoffer, Remco
    Fiers, Martin
    Khanna, Amit
    Bogaerts, Wim
    Dumon, Pieter
    Nesmith, Kevin
    SILICON PHOTONICS III: SYSTEMS AND APPLICATIONS, 2016, 122 : 99 - 156
  • [45] Symposium addresses the challenges of an ageing population
    不详
    British Dental Journal, 2021, 231 (12) : 795 - 795
  • [46] Code Addresses New Ethical Challenges
    Hoke, Tara
    CIVIL ENGINEERING, 2011, 81 (11): : 42 - 43
  • [47] Dual-band, 3-VDC amp addresses tough design challenges
    Hoppin, B
    McCann, D
    Patterson, A
    MICROWAVES & RF, 1998, 37 (10) : 126 - +
  • [48] Automation of Automation - Definition, Components and Challenges
    Schmitz, Stefan
    Schluetter, Markus
    Epple, Ulrich
    2009 IEEE CONFERENCE ON EMERGING TECHNOLOGIES & FACTORY AUTOMATION (EFTA 2009), 2009,
  • [49] Intelligent Design Automation for 2.5/3D Heterogeneous SoC Integration Invited Paper
    Jiang, Iris Hui-Ru
    Chang, Yao-Wen
    Huang, Jiun-Lang
    Chen, Chung-Ping
    2020 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER AIDED-DESIGN (ICCAD), 2020,
  • [50] Scaling Challenges of FinFET Technology at advanced nodes and its impact on SoC design
    Banna, Srinivasa
    2015 IEEE CUSTOM INTEGRATED CIRCUITS CONFERENCE (CICC), 2015,