Substrate resistance extraction with direct boundary element method

被引:0
|
作者
Wang, Xiren [1 ]
Yu, Wenjian [1 ]
Wang, Zeyi [1 ]
机构
[1] Tsinghua Univ, Dept Comp Sci & Technol, EDA Lab, Beijing 100084, Peoples R China
关键词
CAPACITANCE EXTRACTION; INTEGRATED-CIRCUITS; BEM;
D O I
暂无
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
It is important to model the substrate coupling for mixed-signal circuit designs today. This paper presents the direct boundary element method (BEM) for substrate resistance calculation, where only the boundary of substrate region is discretized. Firstly, an efficient scheme for non-uniform element partition is proposed. Secondly, a new technique is presented which can reduce the scale of produced linear system and then accelerate the equation solving, especially for the multiple righthand sides problem like substrate resistance extraction. Experiments show that the proposed method has shown high efficiency compared with existing methods while preserving high accuracy.
引用
收藏
页码:208 / 211
页数:4
相关论文
共 50 条