A 2.5-2.6 dB Noise Figure LNA for 39 GHz band in 22 nm FD-SOI with Back-Gate Bias Tunability

被引:0
|
作者
Nyssens, L. [1 ]
Rack, M. [1 ]
Wane, S. [2 ]
Schwan, C. [3 ]
Lehmann, S. [3 ]
Zhao, Z. [3 ]
Lucci, L. [4 ]
Lugo-Alvarez, J. [4 ]
Gaillard, F. [4 ]
Raskin, J-P [1 ]
Lederer, D. [1 ]
机构
[1] Catholic Univ Louvain, Louvain La Neuve, Belgium
[2] eV Technol, Colombelles, France
[3] GlobalFoundries, Dresden, Germany
[4] Univ Grenoble Alpes, CEA Leti, Grenoble, France
关键词
Low-noise amplifier; FD-SOI CMOS; millimeter-wave; Back-gate bias; 5G; spiral inductor;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents a 2-stage low-noise amplifier (LNA) designed in 22 nm fully-depleted silicon-on-insulator (FD-SOI) technology, covering the N259 and N260 millimeter-wave 5G bands. The prototype features 19.9 dB peak gain, 2.5-2.6 dB noise figure (NF) and 6.6 GHz bandwidth (intersection of 3 dB gain flatness and -10 dB input/output matching), -5.4 dBm third-order input intercept point (IIP3) for a 20.8 mW power dissipation. Modulating the back-gate bias of each stage independently switches the LNA operation mode from a combination of low-noise (0.8 dB variation in NF), high-linearity (similar to 3 dB variation in IIP3) and/or low-power (down to 7.4 mW). Finally, a careful noise contribution analysis of the input matching identifies a 0.58 dB main contribution from the input spiral inductor. EM simulations show that a 0.06 dB improvement in NF can be achieved by using a high-resistivity substrate, if the input inductor design is optimized by stacking several metal layers.
引用
收藏
页码:60 / 63
页数:4
相关论文
共 27 条
  • [1] A Compact 120 GHz LNA in 22 nm FD-SOI with Back-Gate Controllable Variable-Gain
    Rack, M.
    Nyssens, L.
    Le, Q. H.
    Huynh, D. K.
    Kaempfe, T.
    Raskin, J. -P.
    Lederer, D.
    2023 18TH EUROPEAN MICROWAVE INTEGRATED CIRCUITS CONFERENCE, EUMIC, 2023, : 386 - 389
  • [2] DC-40 GHz SPDTs in 22 nm FD-SOI and Back-Gate Impact Study
    Rack, Martin
    Nyssens, Lucas
    Wane, Sidina
    Bajon, Damienne
    Raskin, Jean-Pierre
    2020 IEEE RADIO FREQUENCY INTEGRATED CIRCUITS SYMPOSIUM (RFIC), 2020, : 67 - 70
  • [3] Analysis of Back-Gate Bias Control on EVM Measurements of a Dual-Band Power Amplifier in 22 nm FD-SOI for 5G 28 and 39 GHz Applications
    Nyssens, Lucas
    Nabet, M.
    Rack, M.
    Bendou, Y.
    Wane, S.
    Sombrin, J. B.
    Raskin, J. -p.
    Lederer, D.
    IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2025, 72 (02) : 753 - 762
  • [4] A 26-40GHz Transformer-coupled LNA with 3.1-3.7 dB Noise Figure in 22nm FD-SOI
    Zhang, Qi
    Xia, Bowen
    Chen, Wenhua
    Feng, Haigang
    Wang, Lei
    2022 IEEE MTT-S INTERNATIONAL MICROWAVE WORKSHOP SERIES ON ADVANCED MATERIALS AND PROCESSES FOR RF AND THZ APPLICATIONS, IMWS-AMP, 2022,
  • [5] A Single-Transistor Amplifier With Back-Gate Feedback in 22-nm FD-SOI
    Weinreich, Stephen
    Murmann, Boris
    IEEE SOLID-STATE CIRCUITS LETTERS, 2022, 5 : 210 - 213
  • [6] 28 GHz Down-Conversion Mixer with RF Back-Gate Excitation Topology in 22-nm FD-SOI
    Nabet, Massinissa
    Rack, Martin
    Nyssens, Lucas
    Raskin, Jean-Pierre
    Lederer, Dimitri
    2022 17TH EUROPEAN MICROWAVE INTEGRATED CIRCUITS CONFERENCE (EUMIC 2022), 2022, : 296 - 299
  • [7] A 28 GHz Static CML Frequency Divider with Back-Gate Tuning on 22-nm CMOS FD-SOI Technology
    Hietanen, Mikko
    Aikio, Janne
    Akbar, Rehman
    Rahkonen, Timo
    Parssinen, Aarno
    2019 IEEE 19TH TOPICAL MEETING ON SILICON MONOLITHIC INTEGRATED CIRCUITS IN RF SYSTEMS (SIRF), 2019, : 328 - 330
  • [8] Impact of Back-Gate Biasing on the Transport Properties of 22 nm FD-SOI MOSFETs at Cryogenic Temperatures
    Al Mamun, Fahad
    Vasileska, Dragica
    Esqueda, Ivan Sanchez
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2022, 69 (10) : 5417 - 5423
  • [9] 28GHz Down-Conversion Mixer with RF Back-Gate Excitation Topology in 22nm FD-SOI
    Nabet, Massinissa
    Rack, Martin
    Nyssens, L.
    Raskin, Jean-Pierre
    Lederer, Dimitri
    2022 52ND EUROPEAN MICROWAVE CONFERENCE (EUMC), 2022,
  • [10] 28GHz Down-Conversion Mixer with RF Back-Gate Excitation Topology in 22nm FD-SOI
    Nabet, Massinissa
    Rack, Martin
    Nyssens, L.
    Raskin, Jean-Pierre
    Lederer, Dimitri
    2022 52ND EUROPEAN MICROWAVE CONFERENCE (EUMC), 2022,