Preparation of PbTe Thin Films for High-Sensitive Mid-IR Photodetectors by PECVD

被引:0
|
作者
Mochalov, Leonid [1 ,2 ]
Logunov, Alexander [1 ]
Prokhorov, Igor [1 ]
Sazanova, Tatiana [1 ]
Zelentsov, Sergey [3 ]
Knyazev, Aleksander [3 ]
Starostin, Nikolay [3 ]
Letnianchik, Aleksey [3 ]
Rafailov, Edik [4 ]
Vorotyntsev, Vladimir
机构
[1] Nizhnii Novgorod State Tech Univ, Nizhnii Novgorod, Russia
[2] Univ North Carolina Charlotte, Charlotte, NC 28223 USA
[3] Lobachevsky Univ, Nizhnii Novgorod, Russia
[4] Aston Univ, Birmingham, W Midlands, England
来源
2020 22ND INTERNATIONAL CONFERENCE ON TRANSPARENT OPTICAL NETWORKS (ICTON 2020) | 2020年
基金
俄罗斯科学基金会;
关键词
lead telluride; mid-IR detectors; nanostructures; plasma deposition;
D O I
10.1109/icton51198.2020.9203325
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Lead telluride (PbTe) possesses a good performance as a thermoelectric material due to both a low thermal conductivity and its electrical properties. It has peak thermoelectric characteristics at high temperature and is widely used in spacecraft power applications and as a waveguide-integrated detector monolithically integrated on a silicon substrate and operating at room temperature. In this work PbTe thin films were prepared via direct plasma-chemical interaction of lead and tellurium vapors. Argon of high purity was also used as a career gas for precursors transport to the plasma zone and as a plasma feed gas. The process was carried out at the low pressure (0.01 Torr) in inductively coupled non-equilibrium RF (40.68 MHz) plasma discharge. Optical emission spectroscopy (OES) was used to identify the exited species and to assume the possible mechanisms of plasmachemical reactions. The stoichiometry, structure and morphology of the surface of the materials obtained was also studied by deferent analytical techniques dependently on the conditions of the plasma process.
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页数:4
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